The microscopy suite on the I-FIM premises is intended to allow cross-platform microscopy investigations of any sample by a variety of techniques. This facility is currently equipped with a state-of-the art Atomic Force Microscope (AFM), with other specialized facilities still under development. In addition, there are a diverse range of commercial episcopic and diascopic microscopes supporting various applications such as flake hunting and wire bonding, fluorescent microscopy, high speed image capture etc.
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List No.
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Key specifications for existing equipment
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Picture
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| A. |
AFM
Bruker Dimension XR NanoElectrical SPM with FastScan and Icon Scanners
Available imaging modes
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- Contact mode
- Tapping mode
- Force spectroscopy
- Nanomechnical property mapping
- Kelvin probe force microscopy
- Conductive AFM (with option to couple external photoexcitation)
- Liquid imaging mode
- Scanning electro chemical microscopy
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| B. |
Optical microscope
- Nikon LV‐100ND/BD DIC (Equipped with heating/cooling stage: -195⁰C to 420⁰C)
- Leica TCS SP5 (Equipped with high speed camera)
- An inverted microscope that supports fluorescent imaging.
- Can be converted to a confocal microscope
- Currently integrated with a high-speed camera with the following specifications for ultra-fast image/video capture
- Nikon LV-FM for flake hunting
- To be integrated into the ambient transfer station with 3-axes manipulators for flake hunting and wire bonding
- Under construction
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| C. |
Fluorescent microscope
EVOS M5000
A fully integrated digital inverted microscope for four-color fluorescence transmitted-light and color applications.
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- Camera 3.2 Megapixels, Monochrome, CMOS
- Light Source LED
- Objectives
- OBJ 4X LWD PH, 0.13NA/16.9WD
- OBJ 10X LWD PH, 0.25NA/6.9WD
- OBJ FL 20X LWD, 0.45NA/7.1WD
- PLAN S-APO 40X, NA0.95, 0.18MM
- OBJ PL APO 60X, 1.42NA/0.15WD
- OBJ FLUOR 100X OIL, 1.28/0.21
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