The advanced microscopy suite on the I-FIM premises is intended to allow cross-platform microscopy investigations of any sample by a variety of techniques. This facility is currently equipped with a state-of-the art Atomic Force Microscope (AFM), with other specialized facilities still under development. In addition, there are a diverse range of commercial episcopic and diascopic microscopes supporting various applications such as flake hunting and wire bonding, fluorescent microscopy, high speed image capture etc.
List No.
Key specifications for existing equipment
Picture
A.
AFM
Bruker Dimension XR NanoElectrical SPM with FastScan and Icon Scanners
Available imaging modes
Contact mode
Tapping mode
Force spectroscopy
Nanomechnical property mapping
Kelvin probe force microscopy
Conductive AFM (with option to couple external photoexcitation)
Liquid imaging mode
Scanning electro chemical microscopy
B.
Optical microscope
Nikon LV‐100ND/BD DIC (Equipped with heating/cooling stage: -195⁰C to 420⁰C)
Leica TCS SP5 (Equipped with high speed camera)
An inverted microscope that supports fluorescent imaging.
Can be converted to a confocal microscope
Currently integrated with a high-speed camera with the following specifications for ultra-fast image/video capture
Nikon LV-FM for flake hunting
To be integrated into the ambient transfer station with 3-axes manipulators for flake hunting and wire bonding
Under construction
C.
Fluorescent microscope
EVOS M5000
A fully integrated digital inverted microscope for four-color fluorescence transmitted-light and color applications.
